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- PARK SYSTEMS NX20 Atomic Force Microscope(AFM) 2026.04.30중고장비 PARK SYSTEMS NX-20 Atomic Force Microscope (AFM) XY Scanner NX AFM Head Flexure-guided Z scanner Vacuum sample chuck Motorized XY stage Motorized Z stage Motorized focus stage Acoustic enclosure for NX20
- 주사전자현미경 "SNE4500M Plus" Premium Version of Highest-end Image) Magnification: 30x~150,000x Detector: Secondary Electron(SE) / Backscattered Electron(BSE) Vacuum : High / Low Stage: X,Y, Z, R, T : Fully motorized Navigation mode with CCD camera Application: Semiconductor